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Falloff Test Equipments

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Falloff Test Equipments

2018-8-15C. Test Structures 19 D. Test Equipments - General 21 E. Analysis of the Deviation of the Current-Voltage Characteristics From the Ideal Situation for a . 7 8 have shown that the falloff of the transistor current gain at low currents in non-irradiated transistors is caused by a reduction in the emitter efficiency

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